Thanks to Sara of Frontier IP, PoreXpert v2 will now be available in Portugese, as well as fully updated Italian, German, Spanish and French.

A problem with PoreXpert versions up to 1.8 was that the encryption necessary to protect the software slowed it down.  Using newly purchased software we have been working to improve the speed of the most commonly used operations, and have successfully applied it so they now run comparably as fast for our users as for ourselves.  The graph compares the speed of calculation for a (small) 12x12x12 unit cell, with about 4300 void features – fitting for Vertically Banded and Small Centre Zone structure types (short range size auto-correlations), absolute permeability to water at 20C, and ionic tortuosity.

The cell viewer is now available as a signed Microsoft Installer file from the Downloads page, so that you can see void structures in virtual 3D on your own PC. Many interesting void structures of geometric and real samples are being loaded there.

We are now busy preparing the Sentinel security dongles and download system for the v2 alpha release.

We are currently vigorously testing PoreXpert V2, including non-English language versions as shown, prior to alpha release.

PoreXpert version 2 is a significant advance on the previous version (1.8), so a new, nearly 200 page User Manual has been written to accompany it.

We have programmed an improved tortuosity simulation for PoreXpert version 2.

Success !  We have managed to find a stable mathematical way of identifying the ‘cluster ratio’ for a particular samples, by means of which those voids that are likely to be clusters of smaller voids can be identified. A new PoreXpert operation and user interface have been designed and implemented by our programmer.

The patented, world leading PoreXpert cluster analysis is very powerful, but currently requires trial and error to find out how many voids are likely to be clusters. We are therefore busy automating it.

We are using the University of Plymouth’s world-leading Focussed Ion Beam Scanning Electron Microscope (FIB-SEM) as part of a major on-going consultancy project for a client.